Visit of Great Technical Excellence

Last Monday, December 6, we had the honor of receiving the visit of an icon of Argentine metrology with a strong impact on world metrology: Dr. Ing. Hector Laiz - INTI's Metrology and Quality Manager. 

Laiz is President of the Inter-American Metrology System (SIM) and as a member of the International Committee of Weights and Measures (CIPM) he actively participated in the redefinition of the Metro Convention, which is considered a revolution and milestone in the history of world metrology . He even told us how he was surprised by the repercussion of the event, and the radio and television reports that he gave at that time. 

Source: https://www.inti.gob.ar/areas/metrologia-y-calidad/si

Posted on 12/13/2021 by María Eugenia Diaz - Hitec S.R.L.

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